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BenchTop Spectrophotometer Dual Optical Paths Spectrum Analysis Technology 820N

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BenchTop Spectrophotometer Dual Optical Paths Spectrum Analysis Technology 820N

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Brand Name : CHN spec

Model Number : CS-820N

Certification : CE

Place of Origin : China

MOQ : 1

Price : negotiable

Payment Terms : L/C, T/T, Western Union, MoneyGram

Supply Ability : 1000 per month

Delivery Time : 5-7 days

Packaging Details : Carton box with foam package

Wavelength Range : 360-780nm

Sensor : Dual Light Path Sensor Array

Reflectivity : 0.01%

Size : 430x240x260mm

Interface : USB/RS-232

Reflectance Range : 0~200%

Sphere Diameter : 152mm

Wavwlength Pitch : 10 nm

Storage Memory : 8 GB

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Dual Optical Paths Spectrum Analysis Technology Bench Top Spectrophotometer CS-820N
152mm Sphere Diameter 360-780nm Wavelength Range Bench Top Spectrophotometer For Textile And Dyeing Color Matching

Product Description





spectrophotometer CS-820N for testing color difference

  • Detail Information
  • Product Description
Detail Information
Wavelength Range:360-780nmSize:430x240x260mm
Sensor:Dual Light Path Sensor ArrayInterface:USB/RS-232
Reflectivity Resolution:0.01%Reflectance Range:0~200%

Product Description

Benchtop Spectrophotometer for Reflectance and Transmittance Color Measurement


Part 1. Benchtop Spectrophotometer Introduction

CS-820N is an smart, simple operate and high precise spectrophotometer. It adopts 7 inches touch screen, full wavelength range, Android operate system. Illumination : reflectance D/8° and transmittance D/0°(UV included / UV excluded), high accuracy for color measurement, large storage memory, PC software, because of above advantages, it is used in laboratory for color analysis and communication.

BenchTop Spectrophotometer Dual Optical Paths Spectrum Analysis Technology 820N

Part 2. Benchtop Spectrophotometer Parameter

Illumination/ Viewing System

Reflection: d/8(Diffused illumination, 8 degree viewing)
Simultaneous measurement of SCI/SCE (ISO7724/1, CIE No.15, ASTM E1164,DIN5033 Teil7,JIS Z8722 Condition C standard)
Transmittance d/0(Diffused illumination, 0 degree viewing )

Sphere Diameter152mm
Wavelength360-780nm
Wavelength Pitch10nm

Reflectance Range
Resolution

0-200%
0.01%

Light SourcePulse Xenon Lamp, LED
UV MeasurementInclude UV, 400nm cut, 420nm cut, 460nm cut
Measurement Aperture

Reflectance: XLAV Φ25.4mm/Φ30mm, LAVΦ15mm/18mm,MAVΦ8mm/Φ11mm,SAVΦ3mm/Φ6mm (Aperture size can be custom made) Auto aperture size recognition
Transmittance:Φ17mm/Φ25mm

Repeatability

XLAV Spectrum Reflectance/Transmittance: standard deviation within 0.1%
XLAV Chromaticity value: Standard deviation within ΔE*ab 0.02 * When a white calibration plate is measured 30 x at 5-second intervals after white calibration

Inter-Instrument AgreementXLAV ΔE*ab 0.25 (BCRA Series II, Average measurement of 12 tiles, at 23℃)
Illuminants

A,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,F9,F10,F11,F12
CWF,U30,DLF,NBF,TL83,TL84

DisplayReflectance and Transmittance graph/value, color value, color difference values,pass/fail, color simulation, color assessment, haze, liquid chromaticity values, color tendency
Viewing Angles2° and 10°
Color SpacesL*a*b, L*C*h, Hunter Lab, Yxy, XYZ
Other Indices

WI(ASTM E313-00,ASTM E313-73,CIE/ISO, AATCC, Hunter, Taube Berger, Stensby)
YI(ASTM D1925,ASTM E313-00,ASTM E313-73),Tint(ASTM E313-00,CIE,Ganz),Metamerism index milm, stain fastness, color fastness, ISO brightness, R457, A density, T density, E density, M Density, APHA/Pt-Co/Hazen, Gardner, Saybolt, ASTM color, Haze, Total Transmittance, Opacity, Color Strength

Color DifferenceΔE*ab, ΔE*CH, ΔE*uv, ΔE*cmc, ΔE*94, ΔE*00, ΔE*ab(hunter),555 shade sort
LanguageChinese and English
Storage Memory8GB
Screen Size7 Inches Touch Screen
Operate Temperature5-40℃(40-104F), relative humidity 80% (at 35℃) no condensation
Weight10.8kgs



Part 3. Benchtop Spectrophotometer Advantages


BenchTop Spectrophotometer Dual Optical Paths Spectrum Analysis Technology 820N

1). Adopts reflectance D/8° and transmittance D/0° geometry to measure both opaque and transparent materials.


2). Dual Optical Paths Spectrum Analysis Technology
This technology can simultaneous access to both measurement and instrument internal environmental reference data to ensure instrument accuracy and long-term stability.


3). Compatible with SCI/SCE measurement, Support SCI+SCE Measurement

Instrument adopts D/8 geometry which is highly recommends by CIE (International Commission on Illumination) to meet color measurement of different industries. It supports both SCI (specula component included) and SCE (specular component excluded) mode for better detect of color change. Fast SCI+SCE measurement, test time only need less than 4s.


4). Rotatable Touch Screen with Android Operate System
Screen position and direction can be adjusted according to the instrument test methods.



5). Open Transmittance Measurement Area, no limit on sample size


6). Different Kinds of Accessories for simple measurement
It contains 15 kinds of standard and 12 kinds of optional accessories to measure different kinds of materials



7). Accessory Drawer to Protect and Store Accessories


8). Switchable Reflectance Apertures (30mm,18mm,11mm and 6mm)

BenchTop Spectrophotometer Dual Optical Paths Spectrum Analysis Technology 820N


9). Four Kinds of UV Test Modes for Fluorescence Material Measurement


Part 4. Benchtop Spectrophotometer Packing List

BenchTop Spectrophotometer Dual Optical Paths Spectrum Analysis Technology 820N

BenchTop Spectrophotometer Dual Optical Paths Spectrum Analysis Technology 820N





































































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